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Spectral Response / Quantum Efficiency measurement

QE-R Total Quantum Efficiency Solutions for Solar Cells

Product Name : Total Quantum Efficiency Solutions for Solar Cells

Item No. : QE-R

Description

Total Quantum Efficiency Solutions for Solar Cells
Enlietch's solar cell Spectral Response /Quantum Efficiency calibration capability gets the Calibration Lab. accreditation of ISO /IEC 17025 (TAF) in 2012. Enlitech is the first manufacturer who gets this accreditation in Spectral Response /Quantum Efficiency measurement field. Enlitech’s QE-R system is developed in accordance with IEC, ASTM standards and refers to the measurement procedure of primary metrology institutes to determine Spectral Response /Quantum Efficiency of photovoltaic devices. The QE-R system can also install optional transmittance/reflectance functions and customized testing stages. Enlitech’s QE-R system provides users the one-for-all solution for Spectral Response /Quantum Efficiency measurement for solar cells. It is now implemented by target research centers and major cell manufacturers to improve the conversion efficiency of solar cells.
Representative Customers:
Note: We only provide partial customer lists due to the non-disclosure agreements.

Features:
  • “Exclusive” two DSP dual-phase lock-in amplifiers, which monitors the optical power and measure the device signal simultaneously.
  • “Exclusive” integrated computer-controlled signal switch can reduce cost for maintenance and consumables.
  • High-efficiency light collection system exceeding 70 % collecting rate and provides accurate and stable measurement.
  • Czerny-Turner multi-gratings monochromator with low stray light ( < 10-5), provides precise and rapid measurement.
  • Stable lamp system for long testing time and less calibration time.
  • High repeatability over 99.5 %
  • For various types of solar cells measurement.
Measuring the EQE of Triple Junction Solar Cell by QE-R.
The comparison with different structure’s HIT Solar Cell by QE-R.
Measuring the EQE of Silicon base Triple Junction Solar Cell by QE-R.
Measuring Solar Cell by QE-R is with slighter difference.
System Description:
  • Designed in accordance with IEC 60904-1, 60904-7, 60904-8.
    • Can measure Spectral Response and External Quantum Efficiency.
    • White Light Bias Intensity can reach 0 to 3 solar constants (The same grade as Fraunhofer ISE).
    • Automatic zero-bias function provides a stable short-circuit condition for the solar cell under testing.
    • Integrated system, easy to operate or install.
    • Auto band-gap calculation, provides critical material characteristics.
    • The system can provide customers the most accurate correction parameters by calculating mismatch factor.
    • Provides the most accurate calculation of the whole spectrum short-circuit current density by auto-interlace method.
    • Short-circuit current density spectrum can be the reference for material analysis and process improvement.
    • Provides IQE calculation function. Customers can input the reflectivity of the device to obtain the IQE information.
  • High-efficiency light elliptical reflector:
    • Light collection efficiency > 70 %
    • Provides accurate and stable measurement.
  • Czerny-Turner multi-diffraction gratings monochromator:
    • Low stray light <10-5
    • High stability and fast scan rate.
    • Spectral range can reach 200 nm ~ 2000 nm.
  • Dual-beam optical design:
    • The same design as NIM, NIST and PTB.
    • Monitors the light intensity while acquiring the current signal, which ensures the measurement accuracy.
  • Signal multiplexer:
    • QE-R integrates computer-controlled signal switching multiplexer.
    • Helps customers reduce wiring errors.
  • Signal-to-noise ratio can reach 100 dB, the result of the overall system optimization.
  • DC mode function for DSSC solar cells.
  • High uniformity detector.
Specification :
Items Specifications
Dimensions
  1. 600(W) x 600(D) x 610(H) mm integrated system, excluding the computer
Weight
  1. Main body:80Kg
Mode
  1. AC mode
Wavelength Range
  1. 300 nm ~ 1100 nm
Spot Size
  1. 2 x 2 mm2 or 1 x 4 mm2 (Customizable)
Integrated Lamp System
  1. 150W XQ lamp, instability<0.1 %
  2. Provide 300 nm~2000 nm continuous light
  3. High-efficiency elliptical reflector system with three-axis adjustment knob
  4. Lamp timer
Monochrometor
  1. Czerny-Turner multi-grating monochromator
  2. 0.1 nm wavelength resolution
  3. Scanning range 200 nm ~ 2000 nm
Filter Wheel
  1. Can hold 6 filters
  2. MCU / manual-controlled
  3. LED display
Chopper
  1. 4 Hz ~ 500 Hz,computer-controlled frequency
Lock-in Amplifier
  1. Two DSP dual-phase lock-in amplifiers integrated in the system
  2. Can capture dual-beam signal simultaneously
Detector
  1. Si detector, 10 x 10 mm2
  2. Non-uniformity in the effective area < 0.5%
  3. Detection capability 200 nm ~ 1100 nm
  4. Include 300 nm ~ 1100 nm traceable certificated report
Signal Swith
  1. Computer-controlled 4-to-1 muliplexer for signals switching
Computer System
  1. PC, LCD, Windows systems (Computer desk is not included)
Software
  1. EQE / SR measurement software
  2. Light intensity calibration
  3. Multi-chart storage and editing
  4. Band-gap analysis
  5. Automatic signal status display
  6. IQE calculation (Need to input reflectance)
  7. Short-circuit current density calculation
  8. Short-circuit current density spectrum
  9. Spectral mismatch factor calculation
Eletricity Demand
  1. Optional 110V or 220V AC single-phase,<1.5KVA
Operating Environment
  1. Temperature:20 ℃~40 ℃
  2. Humidity:20%~80%
Monitoring Module
  1. 300 nm~1100 nm, realize double-beam measurement
Voltage Bias
  1. 0V~±5V
Optional Functions :
Items Specifications
Dual-lamp system
  1. Xe and QTH dual-lamp source with two sets of high-efficiency elliptical reflertor system
  2. 700 (W) x 700 (D) x800(H)
Light Bias
  1. 150 W white light bias
Automatic Multi-junction
Measurement Module
  1. Can measure:
    aa-si; au-si double-junction;
    aau-si; auu-si; aug-si triple-junction;
    III-V double-junction and triple-junction;
    OPV double-junction
Reflectance and IQE
Measurement module
  1. 2”integrating sphere
  2. Si detector, wavelength range 300 nm~1100 nm
  3. Integrating sphere switching mechanism
  4. Reflectivity/IQE measurement software
Transmittance
Measurement module
  1. Transmittance measurement detector, Si 300 nm ~ 1100 nm
  2. Transmittance measurement software
  3. Testing fixture,sample size max. 20 x 20 x 3 mm3 (min. 10 x 10 x 1 mm3)
Long-wavelength
Extension Suite
  1. Ge detector, 900 nm ~ 1800 nm with calibration report
  2. InGaAs detector, 1000 nm ~ 2000 nm with calibration report
UPS
  1. Online UPS > 1.5 KVA
Mapping
  1. XY automatic stage, 200 x 200 mm travel distance, 2.5um resolution
  2. Mapping measurement software
  3. Arbitrary wavelength QE scanning function
  4. Automatic light intensity calibration/sample measurement/position adjustment
Others
  1. DC mode,Customized test stage,Digital video camera for monitoring the Contact of probe, reflectance and IQE measurement, absorption spectrum Measurement (Optional reflectance and transmittance kit), Benefit statistical Analysis function, Process improvement analysis, power systems analysis, 3D Beam scanning measurement and analysis, Auto multi-point EQE measurement

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